Search results for "Secondary"
showing 10 items of 1765 documents
Elucidation of the Two-Step Damage Formation Process of Latent Tracks in Poly(allyl diglycol carbonate), PADC: Role of Secondary Low-Energy Electrons
2018
The aim of the present study is to evaluate the mechanisms by which secondary electrons of low energy degrade poly(allyl diglycol carbonate) (PADC) when it is used as a Solid State Nuclear Track De...
Elaboration and characterization of barium silicate thin films.
2008
International audience; Room temperature depositions of barium on a thermal silicon oxide layer were performed in ultra high vacuum (UHV). In-situ X-ray photoelectron spectroscopy (XPS) analyses were carried out as well after exposure to air as after subsequent annealings. These analyses were ex-situ completed by secondary ion mass spectrometry (SIMS) profiles and transmission electron microscopy (TEM) cross-sectional images. The results showed that after air exposure, the barium went carbonated. Annealing at sufficient temperature permitted to decompose the carbonate to benefit of a barium silicate. The silicate layer was formed by interdiffusion of barium with the initial SiO2 layer.
Mechanisms Involved by Reactive Elements upon High Temperature Chromia Scale Growth
2001
The influence of Y 2 O 3 , Pr 2 O 3 , Nd 2 O 3 , Sm 2 O 3 and Yb 2 O 3 coatings on Fe-30Cr alloy oxidation behaviour was investigated at 1000°C in air under atmospheric pressure. Isothermal exposures indicated that the Y 2 O 3 coating was the most protective after 100 hours. Pr 2 O 3 , Nd 2 O 3 and Sm 2 O 3 coatings were less effective, but the less beneficial effect was observed when Yb 2 O 3 coating was applied onto the Fe-Cr alloy surface. Two-stage oxidation experiments in 16 O 2 and then 18 O 2 were performed to get information about the chromia growth phenomena with and without reactive elements. The 18 O-tracer distribution was determined by secondary ion mass spectrometry (SIMS) and…
Bio-imaging with the helium-ion microscope: A review
2021
Scanning helium-ion microscopy (HIM) is an imaging technique with sub-nanometre resolution and is a powerful tool to resolve some of the tiniest structures in biology. In many aspects, the HIM resembles a field-emission scanning electron microscope (FE-SEM), but the use of helium ions rather than electrons provides several advantages, including higher surface sensitivity, larger depth of field, and a straightforward charge-compensating electron flood gun, which enables imaging of non-conductive samples, rendering HIM a promising high-resolution imaging technique for biological samples. Starting with studies focused on medical research, the last decade has seen some particularly spectacular …
Viscous fingering in magnetic fluids: numerical simulation of radial Hele–Shaw flow
1999
Abstract In this paper, the viscous fingering phenomena of the magnetic liquids in the case when the magnetic field is applied normally to the Hele–Shaw cell is investigated by the numerical simulation technique. It is shown that the magnetic field causes additional destabilization of the free interface arising at the air injection in the magnetic liquid. Here the peculiarities of the interface dynamics – inward motion of the tips of the fjords, the gyration radius dependence on the perimeter found by the numerical simulations are in good accordance with the experiments.
On the thermal and thermomechanical assessment of the “Optimized Conservative” helium-cooled lithium lead breeding blanket concept for DEMO
2018
Abstract Within the framework of EUROfusion R&D activities a research campaign has been performed at CEA-Saclay, in close collaboration with the University of Palermo, in order to investigate thermal and thermomechanical performances of the “Optimized Conservative” concept of DEMO Helium-Cooled Lithium Lead breeding blanket (HCLL). Attention has been paid to the HCLL outboard equatorial module (OEM) when subjected to the steady state nominal loading scenario. To this purpose three simplified 3D models, characterized by an increasing level of detail, have been set-up taking into account, firstly, a single radial-toroidal slice, then a basic module geometric unity composed by two adjacent sli…
Corrosion Protection of Steel with Oxide Nanolaminates Grown by Atomic Layer Deposition
2011
Atomic layer deposited (ALD) aluminum and tantalum oxide (Al 2 O 3 and Ta 2 O 5 ) and their nanolaminates were applied as corrosion protection coatings on AISI 52100 steel. The aim was to combine the good sealing properties of Al 2 O 3 with the chemical stability of Ta 2 O 5 and to optimize the coating architecture in order to obtain the best possible long-term durability. Coating composition and morphology were studied with time-of-flight elastic recoil detection analysis (ToF-ERDA), time-of-flight secondary ion mass spectrometry (ToF-SIMS) and field emission scanning electron microscopy (FESEM) and energy dispersive x-ray spectrometry (EDS). Electrochemical properties were studied with vo…
Electron beam induced optical and electronical properties of SiO 2
2000
Abstract Ionizing radiation in dielectric and optically transparent silica as well as thin SiO 2 layers produces defect luminescence as well as charge storage. A comparison of different excitation–relaxation processes like cathodoluminescence, charge injection and trapping, secondary electron field emission, and exoelectron emission leads to a generally similar excitation dose behaviour described by an electron beam saturation dose of 0.01–0.1 C/cm 2 . This suggests a correlation of these four electron excitation mechanisms likely related to the same kind of defect in glassy SiO 2 , the 2-fold-coordinated silicon Si: centre with typical electronic singlet–singlet and singlet–triplet transit…
Kinetics of Bulk Lifetime Degradation in Float‐Zone (FZ) Silico n : Fast Activation and Annihilation of Grown‐In Defects and the Role of Hydrogen vs …
2020
Float-zone (FZ) silicon often has grown-in defects that are thermally activated in a broad temperature window (≈300–800 °C). These defects cause efficient electron-hole pair recombination, which deteriorates the bulk minority carrier lifetime and thereby possible photovoltaic conversion efficiencies. Little is known so far about these defects which are possibly Si-vacancy/nitrogen-related (VxNy). Herein, it is shown that the defect activation takes place on sub-second timescales, as does the destruction of the defects at higher temperatures. Complete defect annihilation, however, is not achieved until nitrogen impurities are effused from the wafer, as confirmed by secondary ion mass spectro…
Scanning electron microscopy analysis of defect clusters in multicrystalline solar grade silicon solar cells
2014
Solar cells from an identical commercial manufacturing unit have been investigated by electroluminescence to first detect the defect clusters. A further analysis has been done by scanning electron microscopy in secondary electron imaging mode to understand the propagation mechanism of defects. It appears that defect cluster boundaries can be very sharp or spread in the bulk with little apparent effect on the overall cell efficiency. And it is shown that grain boundaries act clearly as arrests to further propagation of these defects.