0000000000114052
AUTHOR
Didier Kempf
showing 2 related works from this author
Relationships between strain, microstructure and oxide growth at the nano- and microscale
2008
In the present article, the relationships between oxidation processes, surface strains and the microstructure of duplex stainless steels were investigated. Specimens were oxidized at 500 °C under secondary vacuum for 1 h to form a thin oxide film (thickness in the range of 20-50 nm). Such specimens were considered as the model system for developing novel methods of analysis in understanding the behavior of passive films. The interfacial strain field after oxidation was measured experimentally at the microscale using the point grid method. On the other hand, the chemical composition of the oxide film was determined at the submicroscopic scale by means of local scanning Auger spectroscopy (wi…
High spatial resolution strain measurements at the surface of duplex stainless steels
2007
International audience; The determination of local strain fields at the surface of materials is of major importance for understanding their reactivity. In the present paper, lithography is used to fabricate grid points at the microscale and to map strain gradients within grains and between grains. This method was applied to duplex stainless steels which exhibit heterogeneous strain distributions under straining conditions. The influence of various parameters (the specimen microstructure, the density of slip bands, the number of systems activated and the grid geometry) on the strain value was discussed.