Time-of-flight photoelectron emission microscopy TOF-PEEM: first results

1998

The time structure of the synchrotron radiation at BESSY (Berlin) is used to operate a photoemission electron microscope in a time-of-flight (TOF) mode. The electrons which are emitted from the sample surface with different energies are dispersed in a drift tube subsequent to the imaging optics. The screen of the microscope was replaced by a fast scintillator (tau = 1.4 ns) and the light is detected by an ultra fast gated intensified CCD camera (800 ps gate 1 MHz repetition rate). The resolving power in the energy domain is demonstrated and possible implications on the spatial resolution (chromatic correction) are discussed. Additionally, an improved contrast at very low emission energies i…

Chromatic and Spherical Aberration Correction Using Time-Dependent Acceleration and Lens Fields

2003

Nondestructive full-field imaging XANES-PEEM analysis of cosmic grains

2006

For chemical analysis of submicron particles, mass spectrometric methods have the disadvantage of being destructive. Thus, a nondestructive elemental and chemical mapping with a high spatial resolution prior to mass analysis is extremely valuable to precharacterize the sample. Here, first results are presented of combined XANES (x-ray absorption near-edge structure) and PEEM (photoemission electron microscopy) measurements on a cosmic grain fraction from the Murchison meteorite. This nondestructive full-field imaging method is well suited for a quantitative analysis and for a preselection prior to detailed mass spectrometric investigations with isotopic resolution/selectivity. A spectral un…