0000000000291462
AUTHOR
Francisco Martı́
X-ray diffraction microstructure analysis of mullite, quartz and corundum in porcelain insulators
Abstract The X-ray diffraction microstructure analysis has been performed on commercial samples of the silica and alumina porcelain insulators obtained at 1300 °C, with the same time of firing. The study was carried out on mullite, corundum and quartz by applying several integral breadth methods (i.e. the Williamson–Hall analysis, the Langford method and the Halder–Wagner approximation) and the Fourier analysis (Warren–Averbach method). The apparent crystallite sizes determined for the mullite are direction-dependent (anisotropic) and within each group of samples, on average, the greatest values are obtained along the direction [0 0 1]. With regard to the microstructure of the corundum and …
X-ray powder diffraction phase analysis and thermomechanical properties of silica and alumina porcelains
Chemical and mineralogical characterization, using the Rietveld method, of some silica and alumina rich porcelains and its relationship with thermomechanical properties have been studied in this work. X-ray powder diffraction analysis allows to differ clearly between silica and alumina porcelains. X-ray study shows that both porcelains have a content of vitreous phase. This vitreous phase is higher in the silica than in the alumina porcelain. Dilatometric studies combined with powder diffraction methods shows a strong relationship between silica content and a lower expansion coefficients and between alumina content and a higher crash resistance. Lower contents in vitreous phase in porcelain…