Memory effect and generation-recombination noise of magnetic monopoles in spin ice

Measurement of the activation energies of oxygen ion diffusion in yttria stabilized zirconia by flicker noise spectroscopy

The low-frequency noise in a nanometer-sized virtual memristor consisting of a contact of a conductive atomic force microscope (CAFM) probe to an yttria stabilized zirconia (YSZ) thin film deposited on a conductive substrate is investigated. YSZ is a promising material for the memristor application since it is featured by high oxygen ion mobility, and the oxygen vacancy concentration in YSZ can be controlled by varying the molar fraction of the stabilizing yttrium oxide. Due to the low diameter of the CAFM probe contact to the YSZ film (similar to 10nm), we are able to measure the electric current flowing through an individual filament both in the low resistive state (LRS) and in the high r…

Effect of the non-gaussianity on the measurement error for the filtered 1/f noise intensity

To study the nature of the 1/f noise phenomenon in conductors, we seek a tool for testing different hypotheses of 1/f noise origin. The method analyzing the noise intensity at the output of a bandpass filter is discussed for the case of non-Gaussian processes. Data on measurement error are presented for the 1/f noise intensity in GaAs films and the Gaussian white noise emulated by a computer. A numerical model of 1/f noise as the superposition of telegraph random processes has been created. This method requires further improvement to check the noise for stationarity. Some ideas of how to do that are proposed.

Influence of oxygen ion elementary diffusion jumps on the electron current through the conductive filament in yttria stabilized zirconia nanometer-sized memristor

Abstract The structure of the electron current through an individual filament of a nanometer-sized virtual memristor consisting of a contact of a conductive atomic force microscope probe to an yttria stabilized zirconia (YSZ) thin film deposited on a conductive substrate is investigated. Usually, such investigation is performed by the analysis of the waveform of this current with the aim to extract the random telegraph noise (RTN). Here, we suggest a new indirect method, which is based on the measurement of the spectrum of the low-frequency flicker noise in this current without extracting the RTN, taking into account the geometrical parameters of the filament. We propose that the flicker no…