0000000000522128

AUTHOR

F La Mantia

showing 11 related works from this author

In situ stress, strain and dielectric measurements to understand electrostriction in anodic oxides

2014

Settore ING-IND/23 - Chimica Fisica Applicatastress strain dielectric measurements electrostriction anodic oxides
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Use of Mott-Schottky Plots to Characterise the Amorphous Passive Film/Electrolyte Junction

2010

Mott-Schottky Plots Amorphous Passive Film/Electrolyte Junction
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Le métier de linguiste.

2021

The paper aims to analyze the epistemological status of theoretical linguistics.

Linguistics Language Minimax Recursion Narrative.Settore M-FIL/05 - Filosofia E Teoria Dei Linguaggi
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A Critical Assessment of Mott-Schottky Analysis for the Characterisation of Passive Film-Electrolyte Junctions

2010

Settore ING-IND/23 - Chimica Fisica ApplicataMott-Schottky Analysis Passive Film-Electrolyte Junctions
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Mott-Schottky analysis of differential capacitance data of passive-film electrolyte junctions. Is it really providing correct physical insights on th…

2009

Mott-Schottky analysis differential capacitance passive-film electrolyte junctions electronic properties corrosion layers
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A critical analysis of the theory of amorphous semiconductor Schottky barrier for oxides

2014

Settore ING-IND/23 - Chimica Fisica Applicatatheory of amorphous semiconductor Schottky barrier oxides electrochemical impedance spectroscopy
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A Critical Analysis on the Use of Mott-Schottky Plots to Characterise the Passive Film/Electrolyte Junction

2010

Mott-Schottky Passive Film/Electrolyte Junction
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Modeling of differential admittance behaviour of thin amorphous semiconducting film

2012

The understanding of the electronic properties of thin oxide film is an important step toward the understanding of the mechanisms of film dissolution and breakdown as well as for their application in the field of electrolytic capacitors and solar energy conversion. From this point of view the correct location of the characteristic energy levels (flat band potential, Ufb, and conduction (valence) band edge EC (EV)), of a passive film/electrolyte junction is the preliminary task for a deeper understanding of the mechanism of charge transfer at oxide/electrolyte interface. At this aim the most frequently employed method to locate such characteristic energy levels of semiconductor oxide/electro…

electronic propertieSettore ING-IND/23 - Chimica Fisica Applicatathin oxide filmpassive filmM-S theorya-Nb2O5
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Influence of film thickness and amorphous nature on the differential capacitance measurements of a-Nb2O5/electrolyte junction

2011

differential capacitance measurementSettore ING-IND/23 - Chimica Fisica Applicataanodic Nb2O5
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Versus. Quaderni di Studi Semiotici. Gennaio-Giugno 2014.

2014

Topology Morphodynamics semiotics linguistics continuity.Settore M-FIL/05 - Filosofia E Teoria Dei Linguaggi
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Costruire il consenso

2016

The volume contains proceedings of the International Conference "Costruire il consenso", held in Palermo in 2015. Contributions span from the use of consensus in ancient rhetoric to the analysis of the technology of power in modern and contemporary age.

Rhetorics ConsensusRetorica ConsensoSettore M-FIL/06 - Storia Della FilosofiaSettore M-FIL/05 - Filosofia E Teoria Dei Linguaggi
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