Force measurements and tip shape approximation with the atomic force microscope

2011

The Atomic Force Microscope (AFM) is an instrument with huge impact on modern research in the nanosciences and in nanotechnology. In AFM, a tip which is sharp on a scale of nanometers or tens of nanometers, is scanning along the surface which is imaged. A few among the large numbers of factors that potentially affect the interaction between the tip and the surface were studied in the experimental work that form this Thesis. Friction and elasticity measurements with AFM and the approximation of the tip shape are discussed. Also the contribution of the imaging environment is studied. A commercial AFM was modified into a so called environmental-AFM (env- AFM) , where the imaging conditions, su…

Moniseinäisten nanohiiliputkien elastisuus atomivoimamikroskoopilla mitattuna

2006