0000000000617382

AUTHOR

Denis Martin

showing 2 related works from this author

Le principe de non-discrimination : l'analyse des discours

2016

La recherche a porté, plus particulièrement, sur l’analyse du discours du juge administratif dansla prise en compte des discriminations. Pour mener à bien cette réflexion, ont été mobilisés desjuristes, des sociologues, des linguistes et des spécialistes de science politique. Ce travail s’estdéroulé sur une période de deux ans.La première année a permis de cerner comment le juge administratif appréhendait le principede non-discrimination. Afin d’atteindre cet objectif, il a fallu mobiliser la jurisprudence sur lapériode 2000-2015 (environ 7000 décisions et conclusions). Très vite, deux approches ont étéempruntées, la première, afin d’être exhaustif, a consisté à examiner l’ensemble des crit…

[SHS.SOCIO]Humanities and Social Sciences/Sociology[SHS.DROIT] Humanities and Social Sciences/Law[SHS.SOCIO] Humanities and Social Sciences/Sociology[ SHS.SOCIO ] Humanities and Social Sciences/Sociologyjuges européens[SHS.LANGUE] Humanities and Social Sciences/LinguisticsJuge administratif françaisdroit européen[SHS.SCIPO]Humanities and Social Sciences/Political science[ SHS.DROIT ] Humanities and Social Sciences/Law[SHS.DROIT]Humanities and Social Sciences/Law[ SHS.LANGUE ] Humanities and Social Sciences/Linguistics[SHS.LANGUE]Humanities and Social Sciences/Linguisticsjuge judiciaire[SHS.SCIPO] Humanities and Social Sciences/Political sciencediscrimination
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Optical, structural, and morphological characterisation of epitaxial ZnO films grown by pulsed-laser deposition

2013

We report on ZnO epitaxial growth by pulsed-laser deposition (PLD) on different substrates, such as quartz, sapphire, and GaN template. Approximately 1 mu m-thick films were grown under different substrate temperatures and background oxygen conditions. X-ray diffraction analysis indicated preferential growth along the c-axis direction with a full-width at half maximum(FWHM) of the rocking curve as narrow as 230 arcs in the case of the GaN template. Low-temperature photoluminescence showed A-excitonic emission near 3.36 eV and a FWHM of (DXA)-X-0 emission as small as 2.89 meV at 9 K. Atomic force microscope measurements showed that roughness as low as 18 nm could be obtained. These results p…

Materials sciencePhotoluminescenceStructural propertiesbusiness.industryMetals and AlloysPulsed laser depositionSurfaces and InterfacesSubstrate (electronics)EpitaxySettore ING-INF/01 - ElettronicaSurfaces Coatings and FilmsElectronic Optical and Magnetic MaterialsPulsed laser depositionFull width at half maximumCrystallinityOpticsSurface roughnessZinc oxidePulsed laser deposition Zinc oxide Photoluminescence Structural properties Surface roughness.Materials ChemistrySapphireOptoelectronicsLuminescencebusinessPhotoluminescence
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