0000000000639445
AUTHOR
T. P. H. Sidiropolous
Transient attosecond soft-X-ray spectroscopy in layered semi-metals (Conference Presentation)
X-ray absorption fine-structure (XAFS) spectroscopy is a well-established technique capable of extracting information about a material’s electronic and lattice structure with atomic resolution. While the near-edge region (XANES) of a XAFS spectrum provides information about the electronic configuration, structural information is extracted from the extended XAFS (EXAFS) spectrum, consisting of several hundreds of eV above the absorption edge. With the advent of high harmonic sources, reaching photon energies in soft x-ray (SXR) region, it now becomes possible to connect the spectroscopic capabilities of XAFS to the unprecedented attosecond temporal resolution of a high harmonic source allowi…
Attosecond soft-X-ray spectroscopy of a transition metal dichalcogenide material
We use attosecond soft X-ray pulses between 284 eV to 543 eV for orbital-selective and real-time probing of the opto-electronic response of semi metallic TiS2.