0000000000639445

AUTHOR

T. P. H. Sidiropolous

showing 2 related works from this author

Transient attosecond soft-X-ray spectroscopy in layered semi-metals (Conference Presentation)

2020

X-ray absorption fine-structure (XAFS) spectroscopy is a well-established technique capable of extracting information about a material’s electronic and lattice structure with atomic resolution. While the near-edge region (XANES) of a XAFS spectrum provides information about the electronic configuration, structural information is extracted from the extended XAFS (EXAFS) spectrum, consisting of several hundreds of eV above the absorption edge. With the advent of high harmonic sources, reaching photon energies in soft x-ray (SXR) region, it now becomes possible to connect the spectroscopic capabilities of XAFS to the unprecedented attosecond temporal resolution of a high harmonic source allowi…

Water windowMaterials scienceExtended X-ray absorption fine structureAbsorption edgeAttosecondAtomic physicsAbsorption (electromagnetic radiation)SpectroscopyXANESX-ray absorption fine structure
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Attosecond soft-X-ray spectroscopy of a transition metal dichalcogenide material

2019

We use attosecond soft X-ray pulses between 284 eV to 543 eV for orbital-selective and real-time probing of the opto-electronic response of semi metallic TiS2.

Soft x rayMaterials scienceAttosecond02 engineering and technologySoft X-raysElectron021001 nanoscience & nanotechnology01 natural sciencesPhoton counting3. Good health010309 opticsMetalTransition metalvisual_art0103 physical sciencesvisual_art.visual_art_mediumAtomic physics0210 nano-technologySpectroscopy
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