0000000000739849

AUTHOR

M Kolodyazhnaya

showing 1 related works from this author

Composition dependence ofSi1−xGexsputter yield

2005

Sputtering yields have been measured for unstrained ${\mathrm{Si}}_{1\ensuremath{-}x}{\mathrm{Ge}}_{x}$ $(x=0--1)$ alloys when bombarded with ${\mathrm{Ar}}^{+}$ ions within the linear cascade regime. Nonlinear S-shape dependence of the sputter yield as a function of the alloy composition has been revealed. The dependence is analyzed within the frameworks of the cascade theory conventionally accepted to be the most systematic to date theoretical approach in sputtering. In view of a linear composition dependence predicted for the sputter yield by the cascade theory adapted for polyatomic substrates, the nonlinearity observed in our experiments is shown to be related to the alloying effect on…

010302 applied physicsYield (engineering)Materials scienceDegree (graph theory)Polyatomic ionBinding energy02 engineering and technology021001 nanoscience & nanotechnologyCondensed Matter Physics01 natural sciencesSurface energyElectronic Optical and Magnetic MaterialsCondensed Matter::Materials ScienceSputtering0103 physical sciencesAtomAtomic physics0210 nano-technologyEnergy (signal processing)Physical Review B
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