0000000000799926

AUTHOR

Michael Nolan

0000-0002-5224-8580

showing 1 related works from this author

Atomic Layer Deposition of Intermetallic Fe4Zn9 Thin Films from Diethyl Zinc

2022

| openaire: EC/H2020/765378/EU//HYCOAT We present a new type of atomic layer deposition (ALD) process for intermetallic thin films, where diethyl zinc (DEZ) serves as a coreactant. In our proof-of-concept study, FeCl3 is used as the second precursor. The FeCl3 + DEZ process yields in situ crystalline Fe4Zn9 thin films, where the elemental purity and Fe/Zn ratio are confirmed by time-of-flight elastic recoil detection analysis (TOF-ERDA), Rutherford backscattering spectrometry (RBS), atomic absorption spectroscopy (AAS), and energy-dispersive X-ray spectroscopy (EDX) analyses. The film thickness is precisely controlled by the number of precursor supply cycles, as expected for an ALD process.…

kalvot (tekniikka)Atomic layer depositionGeneral Chemical EngineeringGeneral Chemistryatomikerroskasvatusdepositionthin filmsMaterials ChemistryDiethyl zincprecursorsohutkalvotfysiikkaIntermetallic Fe4Zn9 thin filmsenergyChemistry of Materials
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