0000000000824389
AUTHOR
Jan-kristian Krüger
Processing and properties of nanocrystalline Pb(Sc0.5Ta0.5)O3, Pb(Sc0.5Nb0.5)O3, Pb(Mg1/3Nb2/3)O3and Pb0.76Ca0.24TiO3films and ferroelectric/ relaxor superlattices
Abstract Thin films of relaxor materials, namely Pb(Sc0.5Ta0.5)O3 (PST), Pb(Sc0.5Nb0.5)O3 (PSN) and Pb(Mg1/3Nb2/3)O3 (PMN), and of Pb0.76Ca0.24TiO3 (PTC), which is a classical ferroelectric as bulk material, have been produced to examine whether nanocrystalline relaxor materials show influences in their properties if their grain size is reduced to dimensions known from their nanodomains and to investigate effects in a superlattice of nanocrystalline ferroelectric and relaxor films. At first amorphous films of the different materials were deposited onto a Ti/Pt coated Silicon (100) wafer by reactive rf-sputtering. Different grain sizes could be prepared by a controlled annealing process. The…
Grain-size-induced relaxor properties in nanocrystalline perovskite films
Thin films of ${\mathrm{Pb}}_{0.76}{\mathrm{Ca}}_{0.24}{\mathrm{TiO}}_{3}$ (PTC), which is a classical ferroelectric as a bulk material and of the relaxor material $\mathrm{Pb}({\mathrm{Sc}}_{0.5}{\mathrm{Nb}}_{0.5}){\mathrm{O}}_{3}$, have been produced to find out whether nanocrystalline ferroelectric films show a grain-size-induced relaxor behavior. Amorphous films were deposited onto a $\mathrm{Ti}∕\mathrm{Pt}$ coated silicon (100) wafer by reactive $\text{rf}$ sputtering. Different grain sizes were prepared by a controlled annealing process and they were determined by profile analysis of x-ray diffraction spectra. Temperature dependent Raman spectroscopy was used to look for phase trans…