Untersuchungen zur Mehrfach-Emission von Sekund�relektronen

CuBe- and NaCl-targets are bombarded by single electrons (100–600 eV). The secondary electrons accelerated by 40 kV strike the crystal of a scintillation counter, backed by a multichannel analyser. The probabilityP n of emission ofn=0, 1, 2, 3, ... secondaries can be found from the pulse height distribution. The probability distributionP n =f(n) shows a characteristic deviation from aPoisson's distribution. There was no evidence that there is a preference for even numbers ofn as found byBarrington andAnderson.