0000000000943066

AUTHOR

Marko Vehkamäki

0000-0002-7885-0959

showing 2 related works from this author

Corrosion Protection of Steel with Oxide Nanolaminates Grown by Atomic Layer Deposition

2011

Atomic layer deposited (ALD) aluminum and tantalum oxide (Al 2 O 3 and Ta 2 O 5 ) and their nanolaminates were applied as corrosion protection coatings on AISI 52100 steel. The aim was to combine the good sealing properties of Al 2 O 3 with the chemical stability of Ta 2 O 5 and to optimize the coating architecture in order to obtain the best possible long-term durability. Coating composition and morphology were studied with time-of-flight elastic recoil detection analysis (ToF-ERDA), time-of-flight secondary ion mass spectrometry (ToF-SIMS) and field emission scanning electron microscopy (FESEM) and energy dispersive x-ray spectrometry (EDS). Electrochemical properties were studied with vo…

Materials scienceOxide02 engineering and technologyengineering.material01 natural sciencesCorrosionAtomic layer depositionchemistry.chemical_compoundCoating0103 physical sciencesMaterials ChemistryElectrochemistryta116010302 applied physicsta114Renewable Energy Sustainability and the EnvironmentMetallurgy021001 nanoscience & nanotechnologyCondensed Matter PhysicsSurfaces Coatings and FilmsElectronic Optical and Magnetic MaterialsDielectric spectroscopyElastic recoil detectionSecondary ion mass spectrometryChemical engineeringchemistryengineering0210 nano-technologyLayer (electronics)Journal of the Electrochemical Society
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Studies on atomic layer deposition of IRMOF-8 thin films

2015

Deposition of IRMOF-8 thin films by atomic layer deposition was studied at 260–320 C. Zinc acetate and 2,6-naphthalenedicarboxylic acid were used as the precursors. The as-deposited amorphous films were crystallized in 70% relative humidity at room temperature resulting in an unknown phase with a large unit cell. An autoclave with dimethylformamide as the solvent was used to recrystallize the films into IRMOF-8 as confirmed by grazing incidence x-ray diffraction. The films were further characterized by high temperature x-ray diffraction (HTXRD), field emission scanning electron microscopy, Fourier transform infrared spectroscopy (FTIR), time-of-flight elastic recoil detection analysis (TOF-…

Scanning electron microscopeAnalytical chemistryfield emission microscopesInfrared spectroscopyAtomic layer depositionThin filmFourier transform infrared spectroscopyta116kuormausta114ChemistrySurfaces and InterfacesatomikerroskasvatusCondensed Matter PhysicspalladiumX-ray diffractionSurfaces Coatings and FilmsAmorphous solidfourier transform infrared spectroscopyElastic recoil detectionamorphous filmsloadingCarbon filmthin filmsenergy dispersive spectroscopyatomic layer depositionX-ray spectroscopyohutkalvotzinc compoundsscanning electron microscopyJournal of Vacuum Science and Technology A
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