0000000000969932
AUTHOR
R. Mirzoyan
ATOM-WALL COLLISIONS INFLUENCE ON DARKLINE ATOMIC RESONANCES IN SUBMICRON THIN VAPOUR CELLS.
Recently it was demonstrated that miniaturization of alkali cells, i.e. the use of an extremely thin cell (ETC) for the applications using the electromagnetically induced transparency (EIT) effect, despite to intuitive expectation, does not cause a strong broadening of the dark-line (DL) linewidth. Here we present the conditions when a strong broadening of DL linewidth (more than by 10 times) can be easily observed due to atom-wall collisions influence and this could be a convenient and robust tool for atomwall (i.e. ETC's window material/temperature) collisions study. We present experimental and theoretical results on EIT realized in a Λ- system of 85Rb, D2 line, 5S-5P-5S for a Rb vapour c…