Scanning probe microscopies applied to the study of the domain wall in a ferroelectric crystal.

2007

Summary Scanning near-field optical microscopy is capable of measuring the topography and optical signals at the same time. This fact makes this technique a valuable tool in the study of materials at nanometric scale and, in particular, of ferroelectric materials, as it permits the study of their domains structure without the need of chemical etching and, therefore, not damaging the surface (as will be demonstrated later). We have measured the scanning near-field optical microscopy transmission, as well as the topography, of an RbTiOPO4 single crystalline slab, which exhibits two different of macroscopic ferroelectric domains. A chemical selective etching has been performed to distinguish b…