0000000001034978

AUTHOR

Peter Schweizer

0000-0002-8873-0950

showing 3 related works from this author

Atomically resolved TEM imaging of covalently functionalised graphene

2022

AbstractCovalent functionalisation can be a powerful lever to tune the properties and processability of graphene. After overcoming the low chemical reactivity of graphene, covalent functionalisation led to the generation of new hybrid materials, applicable in a broad variation of fields. Although the process of functionalising graphene is nowadays firmly established, fundamental aspects of the produced hybrid materials remain to be clarified. Especially the atomically resolved imaging is only scarcely explored. Here we show aberration corrected in situ high resolution TEM imaging of dodecyl functionalised monolayer graphene at atomic resolution after an effective mechanical filtering approa…

MicroscòpiaMechanics of MaterialsMechanical EngineeringGeneral Materials ScienceGeneral ChemistryCondensed Matter Physicsddc:600Materials
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Mechanical cleaning of graphene using in situ electron microscopy

2020

Avoiding and removing surface contamination is a crucial task when handling specimens in any scientific experiment. This is especially true for two-dimensional materials such as graphene, which are extraordinarily affected by contamination due to their large surface area. While many efforts have been made to reduce and remove contamination from such surfaces, the issue is far from resolved. Here we report on an in situ mechanical cleaning method that enables the site-specific removal of contamination from both sides of two dimensional membranes down to atomic-scale cleanliness. Further, mechanisms of re-contamination are discussed, finding surface-diffusion to be the major factor for contam…

Materials scienceScienceGeneral Physics and AstronomyNanotechnology02 engineering and technology010402 general chemistry01 natural sciencesArticleGeneral Biochemistry Genetics and Molecular Biologylaw.inventionlawlcsh:ScienceMaterialsMultidisciplinaryGrapheneQGeneral ChemistryContamination021001 nanoscience & nanotechnologyNanocrystalline material0104 chemical sciencesMembranelcsh:QHandling specimensElectron microscope0210 nano-technologyMechanical and structural properties and devicesLayer (electronics)In situ electron microscopyNature Communications
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Low energy nano diffraction (LEND) – A versatile diffraction technique in SEM

2019

Abstract Electron diffraction is a powerful characterization method that is used across different fields and in different instruments. In particular, the power of transmission electron microscopy (TEM) largely relies on the capability to switch between imaging and diffraction mode enabling identification of crystalline phases and in-depth studies of crystal defects, to name only examples. In contrast, while diffraction techniques have found their way into the realm of scanning electron microscopy (SEM) in the form of electron backscatter diffraction and related techniques, on-axis transmission diffraction is still in its infancy. Here we present a simple but versatile setup that enables a ‘…

010302 applied physicsDiffractionMaterials scienceGrapheneScanning electron microscopebusiness.industry02 engineering and technology021001 nanoscience & nanotechnology01 natural sciencesCrystallographic defectAtomic and Molecular Physics and OpticsElectronic Optical and Magnetic Materialslaw.inventionCharacterization (materials science)Electron diffractionlawTransmission electron microscopy0103 physical sciencesOptoelectronics0210 nano-technologybusinessInstrumentationElectron backscatter diffractionUltramicroscopy
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