Noise characterization of analog to digital converters for amplitude and phase noise measurements

International audience; Improvements on electronic technology in recent years have allowed the application of digital techniques in phase noise metrology where low noise and high accuracy are required, yielding flexibility in systems implementation and setup. This results in measurement systems with extended capabilities, additional functionalities and ease of use. In most digital schemes the Analog to Digital Converters (ADCs) set the ultimate performance of the system, therefore the proper selection of this component is a critical issue. Currently, the information available in literature describes in depth the ADC features only at frequency offsets far from the carrier. However, the perfo…