0000000001100589

AUTHOR

Andreas Langner

showing 2 related works from this author

Mechanical and optical properties of as-grown and thermally annealed titanium dioxide from titanium tetrachloride and water by atomic layer deposition

2021

Funding Information: This work was carried out within the MECHALD project funded by Business Finland (Tekes) and is linked to the Finnish Centers of Excellence in Atomic Layer Deposition (ref. 251220) and Nuclear and Accelerator Based Physics (refs. 213503 and 251353) of the Academy of Finland. Funding Information: This work was carried out within the MECHALD project funded by Business Finland (Tekes) and is linked to the Finnish Centers of Excellence in Atomic Layer Deposition (ref. 251220 ) and Nuclear and Accelerator Based Physics (refs. 213503 and 251353 ) of the Academy of Finland. Publisher Copyright: © 2021 The use of thin-films made by atomic layer deposition (ALD) is increasing in …

optical propertiesMaterials scienceAnnealing (metallurgy)elastic modulusresidual stress02 engineering and technologyoptiset ominaisuudet01 natural sciencesStress (mechanics)Atomic layer depositionResidual stressTiO0103 physical sciencesMaterials ChemistryTiO2Composite materialThin filmElastic modulus010302 applied physicsMetals and AlloysSurfaces and Interfacesatomikerroskasvatus021001 nanoscience & nanotechnologyhardnessSurfaces Coatings and FilmsElectronic Optical and Magnetic Materialsfysikaaliset ominaisuudetAtomic Layer DepositionALDatomic layer depositionohutkalvot0210 nano-technologytitaanidioksidiRefractive indexLayer (electronics)
researchProduct

Thermomechanical properties of aluminum oxide thin films made by atomic layer deposition

2022

Funding Information: This work was carried out within the MECHALD project funded by Business Finland and is linked to the Finnish Centers of Excellence in Atomic Layer Deposition (Ref. No. 251220) and Nuclear and Accelerator Based Physics (Ref Nos. 213503 and 251353) of the Academy of Finland. Publisher Copyright: © 2022 Author(s). In microelectromechanical system devices, thin films experience thermal processing at temperatures some cases exceeding the growth or deposition temperature of the film. In the case of the thin film grown by atomic layer deposition (ALD) at relatively low temperatures, post-ALD thermal processing or high device operation temperature might cause performance issues…

lämpökäsittelyjäännösjännityksetALDatomic layer depositionalumiinioksidiohutkalvotatomikerroskasvatusoptiset ominaisuudet
researchProduct