0000000001189575

AUTHOR

Yuri Dehtjars

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Surface Morphology of Single and Multi-Layer Silicon Nitride Dielectric Nano-Coatings on Silicon Dioxide and Polycrystalline Silicon

2019

Silicon nitride (Si3N4) in a form of single and multi-layer nanofilms is proposed to be used as a dielectric layer in nanocapacitors for operation in harsh environmental conditions. Characterization of surface morphology, roughness and chemical bonds of the Si3N4 coatings has an important role in production process as the surface morphology affects the contact surface with other components of the produced device. Si3N4 was synthesized by using low pressure chemical vapour deposition method and depositing single and multi-layer (3 – 5 layers) nanofilms on SiO2 and polycrystalline silicon (PolySi). The total thickness of the synthesized nanofilms was 20 – 60 nm. Surface morphology was investi…

lcsh:TN1-997Materials scienceatomic force microscopyelectron microscopySilicon dioxideScanning electron microscopetechnology industry and agricultureDielectricSurface finishChemical vapor depositionengineering.materialchemistry.chemical_compoundPolycrystalline siliconsilicon nitridechemistrySilicon nitrideAttenuated total reflectionengineeringsurface morphologyGeneral Materials ScienceComposite materiallcsh:Mining engineering. MetallurgyMedžiagotyra
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