6533b7d2fe1ef96bd125ed7f

RESEARCH PRODUCT

Influence of organic material and sample parameters on the surface potential in Kelvin probe measurements

Aivars VembrisRaitis Grzibovskis

subject

film thicknessMaterials scienceGeneral Chemical EngineeringGeneral Physics and Astronomy02 engineering and technologyDielectricwork function01 natural sciencessymbols.namesakeElectrical resistivity and conductivity0103 physical sciences:NATURAL SCIENCES:Physics [Research Subject Categories]General Materials ScienceWork functionGeneral Environmental Science010302 applied physicsKelvin probe force microscopeCondensed matter physicselectrical conductivityFermi levelGeneral EngineeringSurface potentialscanning Kelvin probe021001 nanoscience & nanotechnologyOrganic semiconductororganic materialsElectrodesymbolsGeneral Earth and Planetary Sciences0210 nano-technologyMaterial properties

description

Financial support provided by ERDF 1.1.1.1 activity project Nr. 1.1.1.1/16/A/046 “Application assessment of novel organic materials by prototyping of photonic devices” as well as Scientific Research Project for Students and Young Researchers Nr. SJZ2016/20 realized at the Institute of Solid State Physics, University of Latvia is greatly acknowledged.

10.1007/s42452-019-0766-zhttp://dx.doi.org/10.1007/s42452-019-0766-z