6533b7d3fe1ef96bd12608c7
RESEARCH PRODUCT
X-ray absorption study of Ce?Ti oxide films
Andris AzensJuris PuransC. G. Granqvistsubject
X-ray absorption spectroscopyMaterials scienceExtended X-ray absorption fine structureGeneral Chemical EngineeringInorganic chemistryAnalytical chemistrychemistry.chemical_elementSputter depositionXANESAmorphous solidCeriumchemistryElectrochemistryThin filmTitaniumdescription
Abstract X-ray absorption measurements at the Ce L 3 , L 1 and Ti K-edges have been done to study local structure and electronic properties of CeO 2 –TiO 2 thin films produced by reactive d.c. magnetron sputtering. The local environment around titanium and cerium ions can be described as pyramid-like and cube-like polyhedra, respectively, and the films are amorphous (correlation radius about 10 A). The analysis of Ce L 3 -edge XANES data has shown that the position of the Ce 4f 1 5d and 4f 0 5d states progressively shift towards lower energies with decreasing cerium dioxide content in the thin films.
| year | journal | country | edition | language |
|---|---|---|---|---|
| 2001-04-01 | Electrochimica Acta |