6533b7d3fe1ef96bd1260907

RESEARCH PRODUCT

Atomic-resolution imaging of clean and hydrogen-terminated C(100)-(2×1)diamond surfaces using noncontact AFM

Markus KittelmannAndrew J. MayneAngelika KühnleGérald DujardinWolfgang HarneitA. Von SchmidsfeldMichael ReichlingMarkus NimmrichPhilipp Rahe

subject

Materials scienceHydrogenAtomic force microscopyDimerchemistry.chemical_elementDiamondNanotechnologyConductive atomic force microscopyengineering.materialCondensed Matter PhysicsMolecular physicsElectronic Optical and Magnetic Materialslaw.inventionchemistry.chemical_compoundchemistryAtomic resolutionlawengineeringScanning tunneling microscope

description

Received 22 April 2010; published 14 May 2010High-purity, type IIa diamond is investigated by noncontact atomic force microscopy NC-AFM .Wepresent atomic-resolution images of both the electrically conducting hydrogen-terminated C 100 - 2 1 :Hsurface and the insulating C 100 - 2 1 surface. For the hydrogen-terminated surface, a nearly square unitcell is imaged. In contrast to previous scanning tunneling microscopy experiments, NC-AFM imaging allowsboth hydrogen atoms within the unit cell to be resolved individually, indicating a symmetric dimer alignment.Upon removing the surface hydrogen, the diamond sample becomes insulating. We present atomic-resolutionimages, revealing individual C-C dimers. Our results provide real-space experimental evidence for a 2 1dimer reconstruction of the truly insulating C 100 surface.DOI: 10.1103/PhysRevB.81.201403 PACS number s : 68.37.Ps, 61.66.Bi

yearjournalcountryeditionlanguage
2010-05-14Physical Review B
https://doi.org/10.1103/physrevb.81.201403