6533b7d5fe1ef96bd1263bc9
RESEARCH PRODUCT
<title>Iridium L<formula><inf><roman>3</roman></inf></formula>-edge and oxygen K-edge x-ray absorption spectroscopy of nanocrystalline iridium oxide thin films</title>
D. PailhareyR. KalendarevAlexei KuzminJuris Puranssubject
X-ray absorption spectroscopyMaterials sciencechemistryK-edgeAbsorption spectroscopyAnalytical chemistrychemistry.chemical_elementIridiumSputter depositionThin filmAbsorption (electromagnetic radiation)Nanocrystalline materialdescription
Structural investigations of the short range order around iridium and oxygen ions in nanocrystalline iridium oxide thin films, prepared by dc magnetron sputtering technique, were performed by x-ray absorption spectroscopy. The Ir L3-edge extended x-ray absorption fine structure and the O K-edge x-ray absorption near edge structure signals were measured at room temperature and analyzed within ab initio multiple-scattering and full-multiple-scattering approaches, respectively. The x-ray absorption spectroscopy results indicate the presence in the films of orderd regions - nanocrystals, having a size of about 10 angstrom and a structure rather close to that in crystalline iridium oxide IrO2. Such evidence agrees well with observations by x-ray diffraction, suggesting that the thin films are x-ray amorphous.© (2003) COPYRIGHT SPIE--The International Society for Optical Engineering. Downloading of the abstract is permitted for personal use only.
| year | journal | country | edition | language |
|---|---|---|---|---|
| 2003-08-08 | SPIE Proceedings |