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RESEARCH PRODUCT
Computer-Aided Simultaneous Determination of Noise and Gain Parameters of Microwave Transistors
M. Sanninosubject
PhysicsNoise temperatureNoise measurementNoise generatorNoise spectral densityHardware_INTEGRATEDCIRCUITSElectronic engineeringY-factorFlicker noiseNoise figureNoise floordescription
A new method for the determination of noise and gain parameters of microwave linear two-ports (transistors) is presented. The method allows the simultaneous determination of the two parameter sets through a proper computer-aided procedure which processes the experimental data obtained from a measuring system employing noise meters and generators only. Experimental verifications carried-out on a microwave low noise transistor in S-band are reported.
| year | journal | country | edition | language |
|---|---|---|---|---|
| 1979-10-01 | 9th European Microwave Conference, 1979 |