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RESEARCH PRODUCT
Influence of twinned structure on the morphology of CdTe(111) layers grown by MOCVD on GaAs(100) substrates
Carmen OcalVicente Muñoz-sanjoséC. PolopIván Mora-seróMagdalena Aguilósubject
Inorganic ChemistryCrystallographyChemistryMaterials ChemistryHeterojunctionCrystalliteMetalorganic vapour phase epitaxyTexture (crystalline)Chemical vapor depositionThin filmCondensed Matter PhysicsCrystal twinningCadmium telluride photovoltaicsdescription
Abstract The morphology and structure of CdTe(1 1 1) layers grown on GaAs(1 0 0) by MOCVD have been studied by atomic force microscopy (AFM) and X-ray texture analysis. Growth conditions have been chosen so that mirror-like CdTe layers are obtained. Layers whose growth times vary between 10 s and 2 h have been investigated. The X-ray texture analysis shows that the CdTe layers grown on GaAs substrates that were thermally treated at 580°C for 30 min in a H 2 atmosphere exhibit a (1 1 1) preferential orientation and are twinned. This twinned structure of the (1 1 1)CdTe layer which is observed as 60° rotated triangular crystallites in the AFM images strongly influences the surface morphology. The AFM results have been interpreted using a dynamic scaling theory. The occurrence of a 2D–3D growth transition has been detected after periods of growth in the range of 100–300 s.
| year | journal | country | edition | language |
|---|---|---|---|---|
| 2003-09-01 | Journal of Crystal Growth |