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RESEARCH PRODUCT
Photoelectrochemical and XPS characterisation of oxide layers on 316L stainless steel grown in high-temperature water
F. Di FrancoMarcin PisarekMarcin PisarekMonica SantamariaPhilippe MarcusF. Di QuartoSandrine Zannasubject
Materials sciencePressurised water reactorMetallurgyOxidePressurised water reactorCondensed Matter PhysicCondensed Matter PhysicsElectrochemistryStainless steelchemistry.chemical_compoundSettore ING-IND/23 - Chimica Fisica ApplicatachemistryChemical engineeringRelative thicknessX-ray photoelectron spectroscopyImmersion (virtual reality)Photocurrent spectroscopyXPSElectrochemistryGeneral Materials ScienceMaterials Science (all)Electrical and Electronic Engineeringdescription
Passive films on AISI 316L stainless steel were grown by exposure in high temperature (300 °C and 150 bar) water. X-ray photoelectron spectroscopy was employed to study their composition as a function of immersion time. A photoelectrochemical investigation, supported by electrochemical and impedance measurements, allowed to get information on the solid-state properties of the investigated layers. The experimental results suggest the formation of a stratified layer with an outer iron-rich layer and an inner Cr-rich oxide layer, whose relative thickness and composition are dependent on the immersion time.
| year | journal | country | edition | language |
|---|---|---|---|---|
| 2015-04-19 |