6533b820fe1ef96bd1279890
RESEARCH PRODUCT
Complete characterization of low-noise devices at microwave frequencies: two alternative procedures for HEMTs
A. Di PaolaM. SanninoA. Caddemisubject
Noise temperatureMaterials scienceNoise generatorNoise measurementNoise spectral densityElectronic engineeringFlicker noiseY-factorNoise figureNoise (radio)year | journal | country | edition | language |
---|---|---|---|---|
1995-11-01 | 46th ARFTG Conference Digest |