6533b820fe1ef96bd1279890

RESEARCH PRODUCT

Complete characterization of low-noise devices at microwave frequencies: two alternative procedures for HEMTs

A. Di PaolaM. SanninoA. Caddemi

subject

Noise temperatureMaterials scienceNoise generatorNoise measurementNoise spectral densityElectronic engineeringFlicker noiseY-factorNoise figureNoise (radio)https://doi.org/10.1109/arftg.1995.327138