6533b821fe1ef96bd127acbf

RESEARCH PRODUCT

First images obtained in the near infrared spectrum with the photon scanning tunneling microscope

L. SalomonEric LesniewskaJ. P. GoudonnetF. De Fornel

subject

MicroscopePhotonMaterials sciencebusiness.industryNear-infrared spectroscopyConductive atomic force microscopyAtomic and Molecular Physics and OpticsElectronic Optical and Magnetic Materialslaw.inventionScanning probe microscopyOpticslawMicroscopyElectrical and Electronic EngineeringPhysical and Theoretical ChemistryScanning tunneling microscopebusinessSilicon oxide

description

Abstract First images obtained in the near infrared spectrum with a photon scanning tunneling microscope are presented. The intensity of the light collected by the fibertip, at λ = 1.3 λm , which is a function of the separation between the tip and the sample surface is in agreement with that predicted by the theory. Images of quartz and silicon oxide are presented and the latter is compared with that obtained by an atomic force microscope.

yearjournalcountryeditionlanguage
1993-09-01Optics Communications
https://doi.org/10.1016/0030-4018(93)90462-e