6533b821fe1ef96bd127ae81
RESEARCH PRODUCT
CADEM: calculate X-ray diffraction of epitaxial multilayers
Paulina KomarGerhard Jakobsubject
DiffractionMaterials sciencesuperlatticesSuperlattice02 engineering and technologyEpitaxy01 natural sciencesGeneral Biochemistry Genetics and Molecular BiologyCondensed Matter::Materials ScienceOpticsLattice constantStack (abstract data type)0103 physical sciencesPhysics::Chemical PhysicsX-ray diffraction pattern calculation010306 general physicsCondensed matter physicsbusiness.industryRelaxation (NMR)Layer by layer021001 nanoscience & nanotechnologycomputer programsepitaxial multilayersX-ray crystallography0210 nano-technologybusinessdescription
This article presents a powerful yet simple program, based on the general one-dimensional kinematic X-ray diffraction (XRD) theory, which calculates the XRD patterns of tailor-made multilayers and thus enables quantitative comparison of measured and calculated XRD data. As the multilayers are constructed layer by layer, the final material stack can be entirely arbitrary.
| year | journal | country | edition | language |
|---|---|---|---|---|
| 2017-02-01 | Journal of Applied Crystallography |