6533b822fe1ef96bd127cee9

RESEARCH PRODUCT

Photocurrent spectroscopy in passivity studies

Andrea ZafforaMonica SantamariaF. Di FrancoF. Di Quarto

subject

Materials scienceBand gapPassive film/electrolyte energetics02 engineering and technologyElectrolyte01 natural sciencesCorrosionElectronegativityPhotoelectrochemistryOptical band gap0103 physical sciencesSpectroscopy010302 applied physicsPhotocurrentBilayer filmsbusiness.industryCorrosion layersOxide layersAmorphous semiconductors021001 nanoscience & nanotechnologyAmorphous solidSemiconductorHydroxide layersSettore ING-IND/23 - Chimica Fisica ApplicataOptoelectronicsPassive films0210 nano-technologybusinessFlat band potential

description

The aim of this article is to present photocurrent spectroscopy as useful in situ technique for the physicochemical characterization of passive films and corrosion layers. The response of (both amorphous and crystalline) semiconductor/electrolyte junction under irradiation is treated and discussed in order to get information about solid-state properties such as band gap and flat band potential. The possibility to use Photocurrent Spectroscopy (PCS), in a quantitative way, to get information on the composition of corrosion layers is discussed through a semiempirical correlation between the band gap of the oxides (or hydroxides) and the difference of electronegativity of their constituents. Finally, a model able to simulate the photoelectrochemical behavior of double-layered films is reported.

yearjournalcountryeditionlanguage
2018-04-23
10.1016/b978-0-12-409547-2.13578-4http://hdl.handle.net/10447/531712