6533b827fe1ef96bd1286248
RESEARCH PRODUCT
Error signal artifact in apertureless scanning near-fiel microcospy
Laurent BillotMarc Lamy De La ChapelleDominique BarchiesiPierre-michel AdamJean-louis BijeonRenaud BachelotPascal RoyerAlexandre BouhelierShih-hui ChangStephen GrayGary P. WiederrechtJohn A. Rogerssubject
[SPI.OPTI] Engineering Sciences [physics]/Optics / Photonic[SPI.OPTI]Engineering Sciences [physics]/Optics / PhotonicComputingMilieux_MISCELLANEOUSdescription
International audience
year | journal | country | edition | language |
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2006-09-01 |