6533b829fe1ef96bd1289baa
RESEARCH PRODUCT
t-Curves for n-Hexane
C. CougnardO. BertrandGuy WeberMarie-hélène Simonot-grangeJ. P. Bellatsubject
chemistry.chemical_classificationChromatographyStructure analysisGeneral Chemical Engineeringlcsh:QD450-801Analytical chemistrylcsh:Physical and theoretical chemistry02 engineering and technologySurfaces and InterfacesGeneral Chemistry010501 environmental sciences01 natural sciencesHexanechemistry.chemical_compoundAdsorptionHydrocarbon020401 chemical engineeringchemistryDesorptionMonolayerRelative pressure0204 chemical engineeringLayer (electronics)0105 earth and related environmental sciencesdescription
The adsorption and desorption isotherms of n-hexane on powdered alumina and silica have been studied at 25°C over a wide range of relative pressures. Two t-curves for pore structure analysis are proposed, one for alumina (C = 12) and the second for silica (3 ≤ C ≤ 9). The statistical thickness t of the adsorbed n-hexane layer has been drawn as a function of the relative pressure assuming a maximal thickness of 0.55 nm and a mean thickness of 0.42 nm for the monolayer. The results are discussed in relation to previous published data.
| year | journal | country | edition | language |
|---|---|---|---|---|
| 1992-12-01 | Adsorption Science & Technology |