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RESEARCH PRODUCT

A comparative analysis of electron spectroscopy and first-principles studies on Cu(Pd) adsorption on MgO

Oliver HöfftStefan KrischokStefan KrischokYu. F. ZhukovskiiP. StrackeV. KempterEugene A. Kotomin

subject

OxideAnalytical chemistrySurfaces and InterfacesIsland growthCondensed Matter PhysicsElectron spectroscopySpectral lineSurfaces Coatings and FilmsAugerMetalchemistry.chemical_compoundAdsorptionchemistryvisual_artIonizationMaterials Chemistryvisual_art.visual_art_medium

description

Ultrathin MgO films were grown on a W(1 1 0) substrate while metastable impact electron (MIES) and photoelectron (UPS) spectra were measured in situ; apart from the valence band emission, no additional spectral features were detected. The oxide surface was exposed to metal atoms (Cu, Pd) at RT. A comparison with the DOS extracted from first-principles DFT calculations shows that the metal-induced intensity developing above the top of the O 2p valence band in the UP spectra under Cu(Pd) exposure is caused by Cu 3d (Pd 4d) emission. The emission seen in the MIES spectra is attributed to the ionization of Cu 3d and 4s states of adsorbed neutral Cu atoms in an Auger process, Auger neutralization, involving two electrons from the surface, at least one of them from the metal adsorbate. The shape of the MIES spectra suggests metallic island growth even at the lowest studied exposures, which is supported by the firstprinciples calculations. 2006 Elsevier B.V. All rights reserved.

yearjournalcountryeditionlanguage
2006-09-01Surface Science
https://doi.org/10.1016/j.susc.2005.12.073