6533b82bfe1ef96bd128d7a7
RESEARCH PRODUCT
Accurate and precise lattice parameters by selected-area electron diffraction in the transmission electron microscope
Gian Carlo CapitaniFernando NietoMarcello MelliniEnrico Mugnaiolisubject
Reflection high-energy electron diffractionChemistrybusiness.industryElectron diffraction lattice parameters elliptical distortion micaLattice parametersGEO/06 - MINERALOGIAGeophysicsOpticsElectron diffractionElectron diffractionGeochemistry and PetrologyMicaScanning transmission electron microscopyEnergy filtered transmission electron microscopySelected area diffractionHigh-resolution transmission electron microscopybusinessElectron diffraction; Elliptical distortion; Lattice parameters; MicaKikuchi lineElliptical distortionElectron backscatter diffractiondescription
8 páginas, 6 figuras, 7 tablas.
year | journal | country | edition | language |
---|---|---|---|---|
2009-05-01 |