6533b82cfe1ef96bd128ed83
RESEARCH PRODUCT
Towards the origin of the shear force in near-field microscopy
Martin SchüttlerW. W. RühleHarald GiessenMarkus LippitzMirko Leuschnersubject
Condensed matter physicsbusiness.industryChemistryElectrostatic force microscopeShear forceGeneral EngineeringGeneral Physics and AstronomyAtomic force acoustic microscopyConductive atomic force microscopyOpticsAmplitudeNear-field scanning optical microscopeAdiabatic processbusinessNon-contact atomic force microscopydescription
The shear force from a gold or a graphite sample acting on an approaching near-field optical probe is studied in detail. The adiabatic and dissipative contributions to the force are clearly distinguished by monitoring the amplitude as well as the phase of the tip vibration when the tip approaches the surfaces. We also take into account that not only the damping and the resonance frequency but also the mass of the system changes when the tip approaches the surface. The relative strength of the contributions to the force varies differently but characteristically with the distance of the two samples, starting at a much larger distance in the case of graphite. The adiabatic contribution is larger in the case of the gold sample. Measurements at various temperatures are performed using the gold sample, showing a dependence of the shear force on the varying conditions.
| year | journal | country | edition | language |
|---|---|---|---|---|
| 2001-02-01 |