6533b82cfe1ef96bd128fe81
RESEARCH PRODUCT
Scaling Up a Metric Learning Algorithm for Image Recognition and Representation
Francesc J. FerriAdrian Perez-suaysubject
Clustering high-dimensional dataSet (abstract data type)Range (mathematics)LandmarkMetric (mathematics)Landmark pointRepresentation (mathematics)AlgorithmFacial recognition systemMathematicsdescription
Maximally Collapsing Metric Learning is a recently proposed algorithm to estimate a metric matrix from labelled data. The purpose of this work is to extend this approach by considering a set of landmark points which can in principle reduce the cost per iteration in one order of magnitude. The proposal is in fact a generalized version of the original algorithm that can be applied to larger amounts of higher dimensional data. Exhaustive experimentation shows that very similar behavior at a lower cost is obtained for a wide range of the number of landmark points used.
year | journal | country | edition | language |
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2008-01-01 |