6533b82cfe1ef96bd128fe82

RESEARCH PRODUCT

Up to Date Version of a Computer-Driven Noise Figure Measuring System for the Simultaneous Determination of Noise, Gain and Scattering Parameters of Microwave Transistors

M. SanninoA. Di PaolaG. Mogavero

subject

PhysicsNoise temperatureNoise measurementNoise-figure meterNoise generatorbusiness.industryElectronic engineeringOptoelectronicsY-factorbusinessNoise figureLow-noise amplifierNoise (electronics)

description

The complete characterization of microwave transistors in terms of (four) noise, (four) gain and scattering parameters sets ({N), {G) and [SI, respectively) vs. frequency and bias conditions (and also vs. decreasing temperature, if required) is the first and most important step to design low noise amplifiers (LNAs). The characterization of the device under test (DUT) in terms of [SI is friendly by means of commercial Automatic Network Analyzer; then the { G) set may be determined by computation.

yearjournalcountryeditionlanguage
1995-05-0145th ARFTG Conference Digest
https://doi.org/10.1109/arftg.1995.327113