6533b82cfe1ef96bd1290266

RESEARCH PRODUCT

Positron Annihilation in IR Transmitting GeS₂-Ga₂S₃ Glasses

subject

Chalcogenide GlassPositron TrappingFree-Volume Entities

description

Positron annihilation lifetime spectroscopy combined with Doppler broadening of annihilation radiation was applied to study free-volume entities in GeS2-Ga2S3 glasses affected by Ga additions. It is shown that Ga-related void sub-system plays a decisive role in positron trapping process, while the overall density variation is defined mainly by Ge-related sub-system. These results serve as basis for new characterization route for inner free-volume structure of these glasses.

10.4028/www.scientific.net/ssp.230.221https://doi.org/10.4028/www.scientific.net/SSP.230.221