6533b82dfe1ef96bd12908d1
RESEARCH PRODUCT
A Random Extension for Discriminative Dimensionality Reduction and Metric Learning
Jesús V. AlbertFrancesc J. FerriAdrian Perez-suaysubject
LandmarkOptimization problemDiscriminative modelbusiness.industryGeneralizationPopulation-based incremental learningDimensionality reductionMetric (mathematics)Pattern recognitionExtension (predicate logic)Artificial intelligencebusinessMathematicsdescription
A recently proposed metric learning algorithm which enforces the optimal discrimination of the different classes is extended and empirically assessed using different kinds of publicly available data. The optimization problem is posed in terms of landmark points and then, a stochastic approach is followed in order to bypass some of the problems of the original algorithm. According to the results, both computational burden and generalization ability are improved while absolute performance results remain almost unchanged.
| year | journal | country | edition | language |
|---|---|---|---|---|
| 2009-01-01 |