6533b82dfe1ef96bd1291402
RESEARCH PRODUCT
Real-time monitoring of graphene patterning with wide-field four-wave mixing microscopy
Pasi MyllyperkiöAndreas JohanssonJuha KoivistoinenJukka AumanenVesa-matti HiltunenMika Petterssonsubject
Materials sciencePhysics and Astronomy (miscellaneous)Nanotechnology02 engineering and technology01 natural scienceslaw.invention010309 opticsFour-wave mixinglawNondestructive testing0103 physical sciencesMicroscopygrafeenita116Mixing (physics)Microscale chemistryta114Graphenebusiness.industrygraphene021001 nanoscience & nanotechnologyCharacterization (materials science)four-wave mixing microscopyFemtosecond0210 nano-technologybusinessdescription
The single atom thick two-dimensional graphene is a promising material for various applications due to its extraordinary electronic, optical, optoelectronic, and mechanical properties. The demand for developing graphene based applications has entailed a requirement for development of methods for fast imaging techniques for graphene. Here, we demonstrate imaging of graphene with femtosecond wide-field four-wave mixing microscopy. The method provides a sensitive, non-destructive approach for rapid large area characterization of graphene. We show that the method is suitable for online following of a laser patterning process of microscale structures on single-layer graphene. peerReviewed
| year | journal | country | edition | language |
|---|---|---|---|---|
| 2016-04-11 |