6533b82efe1ef96bd1293afa
RESEARCH PRODUCT
From Measurement to Control of Electromagnetic Waves using a Near‐field Scanning Optical Microscope
Frédérique De FornelBenoit CluzelColette DumasH. NasrallahL. SalomonLoïc Lalouatsubject
PhysicsOpticsbusiness.industryOptoelectronicsNear-field scanning optical microscopeNear and far fieldbusinessElectromagnetic radiationyear | journal | country | edition | language |
---|---|---|---|---|
2013-02-14 | Measurements using Optic and RF Waves |