6533b82efe1ef96bd1293afa

RESEARCH PRODUCT

From Measurement to Control of Electromagnetic Waves using a Near‐field Scanning Optical Microscope

Frédérique De FornelBenoit CluzelColette DumasH. NasrallahL. SalomonLoïc Lalouat

subject

PhysicsOpticsbusiness.industryOptoelectronicsNear-field scanning optical microscopeNear and far fieldbusinessElectromagnetic radiationhttps://doi.org/10.1002/9781118586228.ch2