6533b830fe1ef96bd12968a7

RESEARCH PRODUCT

Study of Copper Nitride Thin Film Structure

Janis TimoshenkoR. KalendarevAlexei KuzminAndris AnspoksAleksandr Kalinko

subject

X-ray absorption spectroscopyMaterials sciencethin filmPhysicsQC1-999General EngineeringAnalytical chemistryGeneral Physics and Astronomychemistry.chemical_element02 engineering and technologyNitridecopper nitridex-ray absorption spectroscopy010402 general chemistry021001 nanoscience & nanotechnology01 natural sciencesCopper0104 chemical scienceschemistryx-ray diffractionX-ray crystallographyThin film0210 nano-technology

description

Abstract X-ray diffraction and x-ray absorption spectroscopy at the Cu K-edge were used to study the atomic structure in copper nitride (Cu3N) thin films. Textured nanocrystalline films are obtained upon dc magnetron sputtering on substrates heated at about 190 °C, whereas amorphous films having strongly disordered structure already in the second coordination shell of copper are deposited in the absence of heating.

10.1515/lpts-2016-0011https://doaj.org/article/9943e22ecac84f798f23ae527c64c2d2