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RESEARCH PRODUCT
Study of Copper Nitride Thin Film Structure
Janis TimoshenkoR. KalendarevAlexei KuzminAndris AnspoksAleksandr Kalinkosubject
X-ray absorption spectroscopyMaterials sciencethin filmPhysicsQC1-999General EngineeringAnalytical chemistryGeneral Physics and Astronomychemistry.chemical_element02 engineering and technologyNitridecopper nitridex-ray absorption spectroscopy010402 general chemistry021001 nanoscience & nanotechnology01 natural sciencesCopper0104 chemical scienceschemistryx-ray diffractionX-ray crystallographyThin film0210 nano-technologydescription
Abstract X-ray diffraction and x-ray absorption spectroscopy at the Cu K-edge were used to study the atomic structure in copper nitride (Cu3N) thin films. Textured nanocrystalline films are obtained upon dc magnetron sputtering on substrates heated at about 190 °C, whereas amorphous films having strongly disordered structure already in the second coordination shell of copper are deposited in the absence of heating.
year | journal | country | edition | language |
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2016-04-01 | Latvian Journal of Physics and Technical Sciences |