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RESEARCH PRODUCT
A Method for Accurate Measurements of Optimum Noise Parameters of Microwave Transistors
M. SanninoGiovanni Martinessubject
Noise temperatureEngineeringNoise measurementNoise-figure meterbusiness.industryAcousticsY-factorTunerCondensed Matter::Mesoscopic Systems and Quantum Hall EffectNoise figureNoise generatorHardware_INTEGRATEDCIRCUITSElectronic engineeringFlicker noisebusinessdescription
A method for measuring losses of the tuner network used as noise source admittance transformer in transistor noise parameter test-set is presented. Since the method is based on noise figure measurements, tuner losses can be determined on-line while performing measurements for determining transistor noise parameters. As experimental verifications the optimum noise parameters of a GaAs FET in the 4 - 12 GHz frequency range, measured through a computer-assisted measuring system, are reported.
| year | journal | country | edition | language |
|---|---|---|---|---|
| 1985-10-01 | 15th European Microwave Conference, 1985 |