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RESEARCH PRODUCT
On the determination of device noise and gain parameters
M. Sanninosubject
Noise temperatureEngineeringbusiness.industryNoise spectral densityY-factorNoise floorNoiseBurst noiseNoise generatorControl theoryElectronic engineeringEffective input noise temperatureElectrical and Electronic Engineeringbusinessdescription
The least-squares fitting of measured noise figures and gains versus input termination admittance is an established procedure to determine linear two-port noise and gain parameters. Unfortunately, the method is liable to the serious inconvenience of yielding often erroneous results or even results without physical meaning. Some criteria are suggested which allow the carrying out of measurements in such a manner as to safely avoid the above drawbacks.
| year | journal | country | edition | language |
|---|---|---|---|---|
| 1979-01-01 | Proceedings of the IEEE |