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RESEARCH PRODUCT
Compositional Evolution of Properties in Epitaxial Films of Relaxor PbMg1/3Nb2/3O3-PbTiO3
M. TyuninaJ. Levoskasubject
PermittivityLattice constantMaterials scienceCondensed matter physicsDielectricThin filmCondensed Matter PhysicsMicrostructureFerroelectricityElectronic Optical and Magnetic MaterialsPerovskite (structure)Pulsed laser depositiondescription
Epitaxial heterostructures of relaxor (1− x) PbMg1/3Nb2/3O3−(x) PbTiO3 thin films with La0.5Sr0.5CoO3 bottom electrodes were grown by pulsed laser ablation on MgO substrates. Perovskite films with x = 0–0.32 were deposited using sub-monolayer mixing from two targets. Both the room-temperature studies of microstructure and studies of dielectric response as a function of frequency and temperature were performed. For all x, a relaxor-like behavior was observed. The compositional evolution of lattice parameter, permittivity, and temperature of dielectric maxima T m was in a qualitative agreement with that in bulk. The relatively low temperatures T m in the presence of an in-plane compression were in contradiction to the previous studies. This was discussed in terms of random fields and polar clusters.
| year | journal | country | edition | language |
|---|---|---|---|---|
| 2005-07-01 | Ferroelectrics |