6533b835fe1ef96bd129f2e6

RESEARCH PRODUCT

Advances in Microwave and Submillimeter-Wave Dielectric Spectroscopic Techniques and their Applications

J. K. VijF. Hufnagel

subject

Measurement methodOpticsLiquid stateSpectrometerChemistrybusiness.industryDielectric lossDielectricbusinessRefractive indexMicrowaveSubmillimeter wavehttps://doi.org/10.1002/9780470142875.ch11