6533b835fe1ef96bd129f2e6
RESEARCH PRODUCT
Advances in Microwave and Submillimeter-Wave Dielectric Spectroscopic Techniques and their Applications
J. K. VijF. Hufnagelsubject
Measurement methodOpticsLiquid stateSpectrometerChemistrybusiness.industryDielectric lossDielectricbusinessRefractive indexMicrowaveSubmillimeter waveyear | journal | country | edition | language |
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2007-03-14 |