6533b835fe1ef96bd12a000e
RESEARCH PRODUCT
High resolution x-ray investigation of periodically poled lithium tantalate crystals with short periodicity
Stefano Riva SanseverinoLuciano CurcioNicola ArgiolasRoberto Luigi OliveriMarco BazzanAlessandro BusaccaCinzia SadaSalvatore Stivalasubject
DiffractionMaterials scienceFerroelectric materialFOS: Physical sciencesGeneral Physics and AstronomyDielectric polarisationElectric domain wallDomain (software engineering)chemistry.chemical_compoundQuality (physics)OpticsLanthanum compoundCondensed Matter - Materials Sciencebusiness.industryMaterials Science (cond-mat.mtrl-sci)Polarization and depolarization.Characterization (materials science)X-ray diffractionDomain wall (magnetism)chemistryLithium tantalateHysteresiDomain engineeringDomain structurebusinessRealization (systems)Optics (physics.optics)Physics - Opticsdescription
Domain engineering technology in lithium tantalate is a well studied approach for nonlinear optical applications. However, for several cases of interest, the realization of short period structures (< 2 ��m) is required, which make their characterization difficult with standard techniques. In this work, we show that high resolution x-ray diffraction is a convenient approach for the characterization of such structures, allowing us to obtain in a nondestructive fashion information such as the average domain period, the domain wall inclination, and the overall structure quality.
| year | journal | country | edition | language |
|---|---|---|---|---|
| 2009-01-01 |