6533b836fe1ef96bd12a0546
RESEARCH PRODUCT
TOTAL INTERNAL REFLECTION ELLIPSOMETRY FOR THE SPECTROSCOPIC INVESTIGATION OF ULTRATHIN SILVER/OXIDE FILMS
D ZolaMla GrilliA PiegariA SytchkovaM FangH HeJ. ShaoMarco Angelo GiambraAntonino ParisiAlessandro Busaccasubject
Thin filmSettore ING-INF/01 - Elettronicayear | journal | country | edition | language |
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2013-01-01 |