6533b836fe1ef96bd12a0546

RESEARCH PRODUCT

TOTAL INTERNAL REFLECTION ELLIPSOMETRY FOR THE SPECTROSCOPIC INVESTIGATION OF ULTRATHIN SILVER/OXIDE FILMS

D ZolaMla GrilliA PiegariA SytchkovaM FangH HeJ. ShaoMarco Angelo GiambraAntonino ParisiAlessandro Busacca

subject

Thin filmSettore ING-INF/01 - Elettronicahttp://hdl.handle.net/10447/104815