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RESEARCH PRODUCT
Gabor filters in industrial inspection: a review. Application to semiconductor industry
Frederic TruchetetOlivier LaligantFabrice MeriaudeauPierrick Bourgeatsubject
EngineeringBasis (linear algebra)business.industryComputingMethodologies_IMAGEPROCESSINGANDCOMPUTERVISIONWavelet transformImage processingFilter bankDomain (software engineering)Filter designComputingMethodologies_PATTERNRECOGNITIONGabor filterComputer visionArtificial intelligencebusinessIndustrial inspectiondescription
This paper focuses on reviewing some recent works of the use of Gabor filters dealing with industrial applications. After a brief recall of Gabor filter basis, the two usual uses of Gabor filters are recalled: filter bank approach and filter design approach. The third part presents recent published works domain by domain. A fourth part exposes our own work with Gabor Filters for defect detection on semiconductor. A short conclusion summarizes the paper.
| year | journal | country | edition | language |
|---|---|---|---|---|
| 2005-11-09 | SPIE Proceedings |